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  • 參數(shù)資料
    型號: 1103CFREQ3BX
    廠商: VECTRON INTERNATIONAL
    元件分類: XO, clock
    英文描述: CRYSTAL OSCILLATOR, CLOCK, 24 MHz - 85 MHz, ACMOS OUTPUT
    封裝: FLAT PACKAGE-16
    文件頁數(shù): 14/19頁
    文件大?。?/td> 1082K
    代理商: 1103CFREQ3BX
    SIZE
    CODE IDENT NO.
    UNSPECIFIED TOLERANCES
    DWG NO.
    REV.
    SHEET
    A
    00136
    N/A
    OS-68338
    I
    4
    in accordance with MIL-PRF-38534, as a minimum. Tabulated records are provided as a part
    of the deliverable data package. Devices are handled in accordance with MIL-STD-1686 for
    Class 1 devices.
    3.4.4 Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered to
    this document. Inspection conditions and standards are documented in accordance with the
    Quality Assurance, ISO-9001 derived, System of QSP-90100.
    3.4.5 Test. The Screening test matrix of Table 5 is tailored for selectable-combination testing to
    eliminate costs associated with the development/maintenance of device-specific documentation
    packages while maintaining performance integrity.
    3.4.6 Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310.
    3.4.7 Ruggedized COTS Design Implementation. Design Pedigree “D” devices (see 5.2) use the
    same robust designs found in the other device pedigrees. They do not include the provisions of
    traceability or the Class-qualified componentry noted in paragraphs 3.4.3 and 4.1.
    4.
    DETAIL REQUIREMENTS
    4.1
    Components
    4.1.1 Crystals. Cultured quartz crystal resonators are used to provide the selected frequency for the
    devices. The optional use of Premium Q swept quartz can, because of its processing to remove
    impurities, be specified for better frequency aging characteristics. In accordance with MIL-
    PRF-55310, the manufacturer has a documented crystal element evaluation program.
    4.1.2 Passive Components. Established Reliability (ER) failure level R passive components are
    procured from QPL suppliers. Lot evaluations are in accordance with MIL-PRF-55310.
    4.1.3 Class S Microcircuits. Microcircuits are procured from wafer lots that have passed MIL-PRF-
    55310 Lot Acceptance Tests for Class S devices. The prescribed die carries a Class 2 ESDS
    classification in accordance with MIL-PRF-38535. When optionally specified, further testing
    in accordance with MIL-PRF-55310 and MIL-PRF-38534 is performed for radiation hardness
    assurance. Those microcircuits, identified by a unique part number, are certified for
    100krad(Si) total ionizing dose (TID), RHA level R (2X minimum margin). NSC, as the
    54ACT designer, rates the SEU LET at >40 MeV and SEL at >120MeV for the FACT
    family (AN-932). Our wafer testing does not include these parameters and determinations, but
    by design similarity.
    4.1.3.1 Class B Microcircuits. When specified, microcircuits assembled into OS-68338 Design
    Pedigree letters “B” and “C” devices ( 5.2a) are procured from wafer lots that have passed
    MIL-PRF-55310 element evaluations for Class B devices.
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