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參數(shù)資料
| 型號(hào)： | 100363F |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | Low Power Dual 8-Input Multiplexer |
| 中文描述： | 低功耗雙8輸入多路復(fù)用器 |
| 文件頁(yè)數(shù)： | 5/8頁(yè) |
| 文件大小： | 127K |
| 代理商： | 100363F |
AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
T
C
= +25C
T
=
+125C
Min
0.70
Units
Conditions
Notes
Min
0.50
Max
2.40
Min
0.60
Max
2.30
Max
3.00
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
Propagation Delay
A
0
–A
7
, B
0
–B
7
to Output
Propagation Delay
S
0
–S
2
to Output
Transition Time
20% to 80%, 80% to 20%
ns
(Notes 7, 8, 9)
0.80
3.00
0.90
2.80
0.80
3.40
ns
Figure 1 and
Figure 2
0.30
1.90
0.30
1.80
0.30
2.10
ns
(Note 10)
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and 55C, temperatures, Subgroups A10 and A11.
Note 10:
Not tested at +25C, +125C, and 55C temperature (design characterization data).
Test Circuitry
DS100310-6
Notes:
V
, V
= +2V, V
= 2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 μF from GND to V
CC
and V
EE
All unused outputs are loaded with 50
to GND
C
L
= Fixture and stray capacitance
≤
3 pF
Pin numbers shown are for flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
www.national.com
5
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