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參數資料
| 型號： | 100353QIX |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Octal D-Type Flip-Flop |
| 中文描述： | 100K SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, PQCC28 |
| 封裝： | 0.450 X 0.450 INCH, PLASTIC, MO-047, LCC-28 |
| 文件頁數： | 4/8頁 |
| 文件大小： | 165K |
| 代理商： | 100353QIX |
AC Electrical Characteristics
(Continued)
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
0.70
T
C
= +25C
Min
0.80
T
C
= +125C
Min
0.80
Units
Conditions
Notes
Max
3.30
Max
3.10
Max
3.50
t
PLH
t
PHL
t
TLH
t
THL
t
s
Propagation Delay
CP to Output
Transition Time
20% to 80%, 80% to 20%
Setup Time
D
n
CEN (Disable Time)
CEN (Release Time)
Hold Time
Pulse Width HIGH
ns
(Notes 7, 8,
9, 11)
Figures 1, 2
0.40
2.20
0.40
2.20
0.40
2.20
ns
(Note 10)
0.30
0.60
1.40
1.50
2.00
0.30
0.60
1.40
1.50
2.00
0.30
0.60
1.40
1.50
2.00
ns
Figures 1, 3
(Note 10)
t
h
t
pw
(H)
D
n
ns
ns
Figures 1, 4
Figures 1, 2
(Note 10)
(Note 10)
CP
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and 55C, temperatures, Subgroups A10 and A11.
Note 10:
Not tested at +25C, +125C, and 55C temperature (design characterization data).
Note 11:
The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.
Test Circuitry
DS100316-6
Notes:
V
CC
, V
CCA
= +2V, V
EE
= 2.5V
T
= 50
ter 3 pF
CC
and V
EE
All unused outputs are
L1 and L2 = equal length 50
to GNDC
L
= impedance linesR
FIGURE 1. AC, Toggle Frequency Test Circuit
www.national.com
4
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