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參數(shù)資料
| 型號： | 100351F |
| 廠商： | National Semiconductor Corporation |
| 元件分類： | 通用總線功能 |
| 英文描述： | Low Power Hex D Flip-Flop |
| 中文描述： | 六角低功耗D觸發(fā)器 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大?。?/td> | 147K |
| 代理商： | 100351F |
AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
375
0.40
T
C
= +25C
Min
375
0.50
T
C
= +125C
Min
375
0.50
Units
Conditions
Notes
Max
Max
Max
f
max
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
t
s
Toggle Frequency
Propagation Delay
CP
a
, CP
b
to Output
Propagation Delay
MR to Output
Transition Time
20% to 80%, 80% to 20%
Setup Time
D
0
–D
5
MR (Release Time)
Hold Time
D
0
–D
5
Pulse Width HIGH
CP
a
, CP
b
, MR
MHz
ns
Figures 2, 3
Figures 1, 3
(Note 10)
2.40
2.20
2.60
(Notes 7, 8, 9)
0.60
2.70
0.70
2.60
0.80
2.90
ns
Figures 1, 4
0.20
1.60
0.20
1.60
0.20
1.60
ns
Figures 1, 3
(Note 10)
0.90
1.60
1.50
0.80
1.80
1.40
0.90
2.60
1.60
ns
Figure 5
Figure 4
Figure 5
t
h
ns
t
pw
(H)
2.00
2.00
2.00
ns
Figures 3, 4
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25C, Temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each Mfg. lot at +25C, Subgroup A9, and at +125C, and 55C Temperature, Subgroups A10 and A11.
Note 10:
Not tested at +25C, +125C and 55C Temperature (design characterization data).
Test Circuitry
DS100318-5
Notes:
V
, V
= +2V, V
= 2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 μF from GND to V
CC
and V
EE
All unused outputs are loaded with 50
to GND
C
L
= Fixture and stray capacitance
≤
3 pF
FIGURE 1. AC Test Circuit
www.national.com
4
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