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參數(shù)資料
| 型號： | 100341 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | Low Power 8-Bit Shift Register |
| 中文描述： | 低功耗8位移位寄存器 |
| 文件頁數(shù)： | 5/10頁 |
| 文件大?。?/td> | 150K |
| 代理商： | 100341 |
AC Electrical Characteristics
(Continued)
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
T
C
= +25C
Min
T
C
= +125C
Min
Units
Conditions
Notes
Max
Max
Max
t
s
Setup Time
D
n
, P
n
0.60
1.70
0.60
1.60
0.60
2.40
ns
S
n
Figure 4
(Note 10)
t
h
Hold Time
D
n
, P
n
0.90
0.50
2.00
0.90
0.50
2.00
0.90
0.50
2.00
ns
S
n
t
pw
(H)
Pulse Width HIGH
ns
Figure 3
CP
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
after power-up. This provides “cold start” specifications which can be considered a worst case condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25C temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and 55C temperatures, Subgroups A10 and A11.
Note 10:
Not tested at +25C, +125C and 55C temperature (design characterization data).
Note 11:
The propagation delay specified is for the switching of a single output. Delays may vary up to 0.40 ns if multiple outputs are switching simultaneously.
Test Circuitry
DS100315-6
Notes:
V
, V
= +2V, V
= 2.5V
L1, L2 and L3 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 μF from GND to V
CC
and V
EE
All unused outputs are loaded with 50
to GND
C
L
= Fixture and stray capacitance
≤
3 pF
Pin numbers shown are for Flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
5
www.national.com
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