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參數(shù)資料
| 型號(hào)： | 100304QI |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Low Power Quint AND/NAND Gate |
| 中文描述： | 100K SERIES, 5 2-INPUT AND/NAND GATE, PQCC28 |
| 封裝： | 0.450 X 0.450 INCH, PLASTIC, MO-047, LCC-28 |
| 文件頁(yè)數(shù)： | 3/8頁(yè) |
| 文件大小： | 109K |
| 代理商： | 100304QI |
Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Ceramic
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
65C to +150C
+175C
7.0V to +0.5V
V
EE
to +0.5V
50 mA
ESD (Note 2)
≥
2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
Supply Voltage (V
EE
)
Note 1:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
55C to +125C
5.7V to 4.2V
Military Version
DC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND, T
C
= 55C to +125C
Symbol
Parameter
V
OH
Output HIGH Voltage
Min
1025
Max
870
Units
mV
T
C
Conditions
Notes
0C to
+125C
55C
0C to
+125C
55C
0C to
+125C
55C
0C to
+125C
55C
55C
+125C
55C to
+125C
55C to
+125C
1085
1830
870
1620
mV
mV
V
IN
= V
IH
(Max)
or V
IL
(Min)
Loading with
50
0 to 2.0V
(Notes 3, 4, 5)
V
OL
Output LOW Voltage
1830
1035
1555
mV
mV
V
OHC
Output HIGH Voltage
1085
mV
mV
V
IN
= V
IH
(Min)
or V
IL
(Max)
Loading with
50
to 2.0V
(Notes 3, 4, 5)
V
OLC
Output LOW Voltage
1610
1555
870
mV
mV
V
IH
Input HIGH Voltage
1165
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
EE
= 4.2V
V
IN
= V
IL
(Min)
(Notes 3, 4, 5, 6)
V
IL
Input LOW Voltage
1830
1475
mV
(Notes 3, 4, 5, 6)
I
IL
Input LOW Current
0.50
μA
(Notes 3, 4, 5)
Input High Current
D
2a
–D
2e
D
1a
–D
1e
250
350
μA
0C to
+125C
V
EE
= 5.7V
V
IN
= V
IH
(Max)
(Notes 3, 4, 5)
I
IH
D
2a
–D
2e
D
1a
–D
1e
Power Supply Current
350
500
25
μA
55C
I
EE
75
mA
55C to
+125C
Inputs Open
(Notes 3, 4, 5)
Note 3:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4:
Screen tested 100% on each device at 55C, +25C, and +125C, Subgroups, 1, 2 3, 7, and 8.
Note 5:
Sample tested (Method 5005, Table I) on each manufactured lot at 55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8.
Note 6:
Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
www.national.com
3
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