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    參數(shù)資料
    型號(hào): XQ4010E-3PG196M
    廠商: Xilinx, Inc.
    英文描述: QML High-Reliability FPGAs
    中文描述: QML第高可靠性的FPGA
    文件頁(yè)數(shù): 2/36頁(yè)
    文件大?。?/td> 285K
    代理商: XQ4010E-3PG196M
    QPRO XQ4000E/EX QML High-Reliability FPGAs
    2
    www.xilinx.com
    1-800-255-7778
    DS021 (v2.2) June 25, 2000
    Product Specification
    R
    XQ4000E Switching Characteristics
    XQ4000E Absolute Maximum Ratings
    (1)
    Table 1:
    XQ4000E/EX Field Programmable Gate Arrays
    Device
    Max.
    Logic
    Gates
    (No RAM)
    Max.
    RAM Bits
    (No
    Logic)
    Typical
    Gate Range
    (Logic and
    RAM)
    (1)
    CLB
    Matrix
    Total
    CLBs
    Number
    of
    Flip-Flops
    Max.
    Decode
    Inputs
    per Side
    Max.
    User
    I/O
    Packages
    XQ4005E
    5,000
    6,272
    3,000 - 9,000
    14 x 14
    196
    616
    42
    112
    PG156,
    CB164
    XQ4010E
    10,000
    12,800
    7,000 - 20,000
    20 x 20
    400
    1,120
    60
    160
    PG191,
    CB196,
    HQ208
    XQ4013E
    13,000
    18,432
    10,000 - 30,000
    24 x 24
    576
    1,536
    72
    192
    PG223,
    CB228,
    HQ240
    XQ4025E
    25,000
    32,768
    15,000 - 45,000
    32 x 32
    1,024
    2,560
    96
    256
    PG299,
    CB228
    XQ4028EX
    28,000
    32,768
    18,000 - 50,000
    32 x 32
    1,024
    2,560
    96
    256
    PG299,
    CB228,
    HQ240,
    BG352
    Notes:
    1.
    Max values of Typical Gate Range include 20-30% of CLBs used as RAM.
    Symbol
    Description
    Units
    V
    CC
    V
    IN
    V
    TS
    T
    STG
    T
    SOL
    T
    J
    Supply voltage relative to GND
    Input voltage relative to GND
    (2)
    Voltage applied to High-Z output
    (2)
    0.5 to +7.0
    V
    0.5 to V
    CC
    + 0.5
    0.5 to V
    CC
    + 0.5
    65 to +150
    V
    V
    Storage temperature (ambient)
    °
    C
    °
    C
    °
    C
    °
    C
    Maximum soldering temperature (10s @ 1/16 in. = 1.5 mm)
    +260
    Junction temperature
    Ceramic package
    +150
    Plastic package
    +125
    Notes:
    1.
    Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
    ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions
    is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.
    Maximum DC excursion above V
    or below Ground must be limited to either 0.5V or 10 mA, whichever is easier to achieve. During
    transitions, the device pins may undershoot to
    2.0V or overshoot to V
    CC
    + 2.0V, provided this over or undershoot lasts less than
    10 ns and with the forcing current being limited to 200 mA.
    2.
    相關(guān)PDF資料
    PDF描述
    XQ4010E-3PG196N QML High-Reliability FPGAs
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