參數(shù)資料
型號: TTSI1K16T3TL
英文描述: 1024-Channel, 16-Highway Time-Slot Interchanger
中文描述: 1024通道,16道時(shí)隙交換器
文件頁數(shù): 29/64頁
文件大?。?/td> 1110K
代理商: TTSI1K16T3TL
Preliminary Data Sheet
February 1999
TTSI1K16T
1024-Channel, 16-Highway Time-Slot Interchanger
29
Lucent Technologies Inc.
JTAG Boundary-Scan Specification
Principle of the Boundary Scan
The boundary scan (BS) is a test aid for chip, module, and system testing. The key aspects of BS are as follows:
1. Testing the connections between ICs on a particular board.
2. Observation of signals to the IC pins during normal operating functions.
3. Controlling the built-in self-test (BIST) of an IC. TTSI1K16T does not support BS-BIST.
Designed according to the IEEE Std. 1149.1-1990 standard, the BS test logic consists of a defined interface: the
test access port (TAP). The TAP is made up of four signal pins assigned solely for test purposes. The fifth test pin
ensures that the test logic is initialized asynchronously. The BS test logic also comprises a 16-state TAP controller,
an instruction register with a decoder, and several test data registers (BS register, BYPASS register, and IDCODE
register). The main component is the BS register that links all the chip pins to a shift register by means of special
logic cells. The test logic is designed in such a way that it is operated independently of the application logic of the
TTSI1K16T (the mode multiplexer of the BS output cells may be shared). Figure 14 illustrates the block diagram of
the TTSI1K16T’s BS test logic.
5-3923(F)r.4
Figure 14. Block Diagram of the TTSI1K16T's Boundary-Scan Test Logic
BOUNDARY-SCAN REGISTER
TDI
TRST
TMS
TCK
TAP
CONTROLLER
INSTRUCTION
DECODER
OUT
TDO
IN
MUX
CHIP KERNEL
(UNAFFECTED BY BOUNDARY-SCAN TEST)
IDCODE REGISTER
BYPASS REGISTER
INSTRUCTION REGISTER
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