參數(shù)資料
型號: STP1100BGA-100
元件分類: 微控制器/微處理器
英文描述: 32-BIT, 100 MHz, RISC PROCESSOR, PBGA272
封裝: PLASTIC, BGA-272
文件頁數(shù): 31/32頁
文件大?。?/td> 168K
代理商: STP1100BGA-100
8
STP1100BGA
Preliminary
SPARC v8 32-Bit Microprocessor With PCI/DRAM Interfaces
microSPARC-IIep
December 1997
Sun Microsystems, Inc
ROM_CS_L
Out
3.
Flash memory Chip Select.
ROM_OE_L
Out
3.
Flash memory Output Enable.
ROM_WE_L
Out
3.
Flash memory Write Enable.
Clock and Timing Signals
Signal
Type
Note
Description
DIV_CTL[1:0]
In
4.
These two input pins set the multiplication factor for the EXT_CLK1 clock input pin to the
internal processor clock and internal system clock as shown in
Table 2.
SP_SEL[2:0]
In
4.
Memory Speed Select. Selects memory interface timing. Refer to
Table 3 for settings.
REF_CLOCK
Out
3.
Clock output at frequency of processor core. Used for testing and monitoring.
EXT_CLK1
In
8.
External Input Clock 1. While under PLL-bypass mode, an EXclusiveOR is performed on
EXT_CLK1 and EXT_CLK2 to produce the processor clock. Otherwise, EXT_CLK1 is
used to produce the processor clock using the Phase-Locked Loop.
EXT_CLK2
(MODE select)
In
4.
External Input Clock 2. While under PLL-bypass mode, an EXclusiveOR is performed on
EXT_CLK1 and EXT_CLK2 to produce the processor clock. Otherwise, during power-up,
EXT_CLK2 is used to select PCI Host or Satellite mode. Therefore, while PLL is not
bypassed, if EXT_CLK2 is tied high, microSPARC-IIep functions in PCI Satellite mode.
microSPARC-IIep functions in PCI Host mode by default.
PLL_BYP_L
In
5.
PLL-bypass mode select.
When tied high during power-up, microSPARC-IIep output of Phase-Locked Loop is used
to generate processor clock.
When tied low during power-up, PLL-bypass mode is selected and the processor clock is
generated using EXclusiveOR of EXT_CLK1 and EXT_CLK2.
PLL_RST
In
5.
Low until VDD1 > 2.0V and for 2 us or more when power-up.
JTAG Signals
Signal
Type
Note
Description
JTAG_CK
In
5.
Clock for boundary scan registers.
JTAG_MS
In
5.
Mode Select.
JTAG_TDI
In
5.
Test Data Input.
JTAG_TRST_L
In
4.
Test Reset.
JTAG_TDO
Out
3.
Test Data Output.
DRAM and Flash Memory Signals (Continued)
Signal
Type
Note
Description
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