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參數(shù)資料
| 型號(hào)： | PCF1252-X |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Threshold detector and reset generator |
| 中文描述： | 閾值檢測(cè)器和復(fù)位發(fā)生器 |
| 文件頁(yè)數(shù)： | 12/16頁(yè) |
| 文件大?。?/td> | 107K |
| 代理商： | PCF1252-X |
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1998 Apr 16
5
Philips Semiconductors
Product specication
Threshold detector and reset generator
PCF1252-X family
Notes
1. Long time stability of COMIN switch point VSP and voltage trip point VTRIP: within 10 years of continuous operation
at VDD(max) and an average operating temperature of 55 °C the drift of VSP will not exceed ±10 mV. The maximum
drift for VTRIP will not exceed (±VTRIP(typ)/VSP(typ)) 10 mV.
2. Values given per degree Kelvin; tested on a sample basis.
3. Conformance to these specifications is only guaranteed if the slew rate of VDD is less than 25 V/ms.
COMIN
VSP
COMIN switch point
Tamb =25 °C; note 1
1.28
1.30
1.32
V
SP
COMIN switch point temperature
coefcient
note 2
±0.1
±0.5
mV/K
SELECT
VIL
LOW level input voltage
0.3VDD
V
VIH
HIGH level input voltage
0.7VDD
V
SELECT and COMIN
ILI
LOW level leakage input current
1.0
A
ILI
HIGH level leakage input current
1.0
A
POWF, RESET and COMOUT
IO
output sink current
VO = 0.4 V;
VDD = 2.4 V;
see Fig.6
13
mA
IO
output source current
VO = 2.0 V;
VDD = 2.4 V;
see Fig.7
0.75
2
mA
tR
reset time
CCT = 1 nF; note 3
400
1000
2000
s
tS
save time
CCT = 1 nF; note 3
40
100
200
s
tR/tS
reset to save time ratio
10
Cint
CT internal capacitance
100
pF
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
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