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Electrical Specifications
Memory Characteristics
MC68H(R)C908JL3E/JK3E/JK1E
—
Rev. 2.0
Technical Data
MOTOROLA
Electrical Specifications
209
18.14 Memory Characteristics
Table 18-11. Memory Characteristics
Characteristic
Symbol
Min
Max
Unit
RAM data retention voltage
V
RDR
1.3
—
V
FLASH program bus clock frequency
—
1
—
MHz
FLASH read bus clock frequency
f
Read(1)
NOTES:
1. f
Read
is defined as the frequency range for which the FLASH memory can be read.
2. If the page erase time is longer than t
Erase
(Min), there is no erase-disturb, but it reduces the endurance of the
FLASH memory.
3. If the mass erase time is longer than t
MErase
(Min), there is no erase-disturb, but it reduces the endurance of
the FLASH memory.
4. t
rcv
is defined as the time it needs before the FLASH can be read after turning off the high voltage charge pump,
by clearing HVEN to logic 0.
5. tHV is defined as the cumulative high voltage programming time to the same row before next erase.
t
HV
must satisfy this condition: t
nvs
+ t
nvh
+ t
pgs
+ (t
PROG
×
32)
≤
t
HV
max.
6. The minimum row endurance value specifies each row of the FLASH memory is guaranteed to work for at least
this many erase / program cycles.
7. The minimum row endurance value specifies each row of the FLASH memory is guaranteed to work for at least
this many erase / program cycles.
8. The FLASH is guaranteed to retain data over the entire operating temperature range for at least the minimum
time specified.
32k
8M
Hz
FLASH page erase time
t
Erase(2)
1
—
ms
FLASH mass erase time
t
MErase(3)
4
—
ms
FLASH PGM/ERASE to HVEN set up time
t
nvs
10
—
μ
s
FLASH high-voltage hold time
t
nvh
5
—
μ
s
FLASH high-voltage hold time (mass erase)
t
nvh1
100
—
μ
s
FLASH program hold time
t
pgs
5
—
μ
s
FLASH program time
t
PROG
30
40
μ
s
FLASH return to read time
t
rcv(4)
1
—
μ
s
FLASH cumulative program hv period
t
HV(5)
—
4
ms
FLASH row erase endurance
(6)
FLASH row program endurance
(7)
FLASH data retention time
(8)
—
10k
—
cycles
—
10k
—
cycles
—
10
—
years