參數(shù)資料
型號: KFN2G16Q2M-DEB6
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: MuxOneNAND FLASH MEMORY
中文描述: MuxOneNAND閃存
文件頁數(shù): 80/124頁
文件大小: 1550K
代理商: KFN2G16Q2M-DEB6
MuxOneNAND1G(KFM1G16Q2M-DEB5)
MuxOneNAND2G(KFN2G16Q2M-DEB5)
FLASH MEMORY
80
There are multiple methods for erasing data in the device including Block Erase and Multi-Block Erase.
3.10.1 Block Erase Operation
See Timing Diagram 6.8
The device can be erased one block at a time. To erase a block is to write all 1's into the desired memory block by executing the Inter-
nal Erase Routine. All previous data is lost.
Block Erase Operation Flow Chart
Start
Write ’DFS*, FBA’ of Flash
Add: F100h DQ=DFS*, FBA
Write ’Erase’ Command
Add: F220h DQ=0094h
Wait for INT register
low to high transition
Add: F241h DQ=[15]=INT
Add: F240h DQ[10]=Error
Erase completed
DQ[10]=0
YES
Erase Error
NO
Read Controller
Status Register
: If erase operation results in an error, map out
*
the failing block and replace it with another block.
Write 0 to interrupt register
Add: F241h DQ=0000h
* DFS is for DDP
3.10 Erase Operation
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KFN1G16Q2M-DED5 MuxOneNAND FLASH MEMORY
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KFN2G16Q2M-DED5 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:MuxOneNAND FLASH MEMORY
KFN2G16Q2M-DED6 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:MuxOneNAND FLASH MEMORY
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