參數(shù)資料
型號: K4S511633F-L
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 8M x 16Bit x 4 Banks Mobile SDRAM
中文描述: 8米× 16 × 4銀行移動SDRAM
文件頁數(shù): 5/12頁
文件大?。?/td> 114K
代理商: K4S511633F-L
K4S511633F-Y(P)C/L/F
September 2004
5
Mobile-SDRAM
DC CHARACTERISTICS
Recommended operating conditions (Voltage referenced to V
SS
= 0V, T
A
= -25 to 70
°
C)
NOTES:
1. Measured with outputs open.
2. Refresh period is 64ms.
3. Internal TCSR can be supported(In commercial Temp : Max 40
°
C/Max 70
°
C).
4. K4S511633F-Y(P)C**
5. K4S511633F-Y(P)L**
6. K4S511633F-Y(P)F**
7. Unless otherwise noted, input swing IeveI is CMOS(VIH /VIL=VDDQ/VSSQ).
Parameter
Symbol
Test Condition
Version
Unit
Note
-75
-1H
-1L
Operating Current
(One Bank Active)
I
CC1
Burst length = 1
t
RC
t
RC
(min)
I
O
= 0 mA
120
120
110
mA
1
Precharge Standby Current in
power-down mode
I
CC2
P
CKE
V
IL
(max), t
CC
= 10ns
1.0
mA
I
CC2
PS
CKE & CLK
V
IL
(max), t
CC
=
1.0
Precharge Standby Current
in non power-down mode
I
CC2
N
CKE
V
IH
(min), CS
V
IH
(min), t
CC
= 10ns
Input signals are changed one time during 20ns
20
mA
I
CC2
NS
CKE
V
IH
(min), CLK
V
IL
(max), t
CC
=
Input signals are stable
10
Active Standby Current
in power-down mode
I
CC3
P
CKE
V
IL
(max), t
CC
= 10ns
8
mA
I
CC3
PS
CKE & CLK
V
IL
(max), t
CC
=
4
Active Standby Current
in non power-down mode
(One Bank Active)
I
CC3
N
CKE
V
IH
(min), CS
V
IH
(min), t
CC
= 10ns
Input signals are changed one time during 20ns
45
mA
I
CC3
NS
CKE
V
IH
(min), CLK
V
IL
(max), t
CC
=
Input signals are stable
30
mA
Operating Current
(Burst Mode)
I
CC
4
I
O
= 0 mA
Page burst
4Banks Activated
t
CCD
= 2CLKs
170
150
150
mA
1
Refresh Current
I
CC
5
t
RC
t
RC
(min)
300
280
240
mA
2
Self Refresh Current
I
CC
6
CKE
0.2V
-C
1500
uA
4
-L
1200
5
-F
Internal TCSR
Max 40
Max 70
°
C
3
Full Array
900
1200
uA
6
1/2 of Full Array
800
900
1/4 of Full Array
700
800
相關PDF資料
PDF描述
K4S511633F-YC 8M x 16Bit x 4 Banks Mobile SDRAM
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