參數(shù)資料
型號: K4F641612E
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 4M x 16bit CMOS Dynamic RAM with Fast Page Mode
中文描述: 4米× 16位的CMOS動態(tài)隨機存儲器的快速頁面模式
文件頁數(shù): 9/35頁
文件大?。?/td> 400K
代理商: K4F641612E
CMOS DRAM
K4F661612E,
K4F641612E
Industrial Temperature
t
ASC
,
t
CAH
are referenced to the earlier CAS falling edge.
t
CP
is specified from the last CAS rising edge in the previous cycle to the first CAS falling edge in the next cycle.
t
CWD
is referenced to the later CAS falling edge at word read-modify-write cycle.
t
CWL
is specified from W falling edge to the earlier CAS rising edge.
t
CSR
is referenced to earlier CAS falling before RAS transition low.
t
CHR
is referenced to the later CAS rising high after RAS transition low.
t
DS
is specified for the earlier CAS falling edge and
t
DH
is specified by the later CAS falling edge.
If
t
RASS
100us, then RAS precharge time must use
t
RPS
instead of
t
RP
.
For RAS-only-Refresh and Burst CAS-before-RAS refresh mode, 4096 cycles(4K/8K) of burst refresh must be executed within
64ms before and after self refresh, in order to meet refresh specification.
For distributed CAS-before-RAS with 15.6us interval, CBR refresh should be executed with in 15.6us immediately before and
after self refresh in order to meet refresh specification.
t
CSR
t
CHR
RAS
LCAS
UCAS
t
DS
t
DH
LCAS
UCAS
DQ0 ~ DQ15
Din
21.
20.
19.
15.
14.
13.
18.
17.
16.
22.
相關(guān)PDF資料
PDF描述
K4F661612E 4M x 16bit CMOS Dynamic RAM with Fast Page Mode
K4H1G0838A-TCA0 DIODE ZENER SINGLE 200mW 6.2Vz 0.05mA-Izt 0.05 1uA-Ir 5 SOD-323 3K/REEL
K4H641638A-TCA0 DIODE ZENER SINGLE 150mW 6.2Vz 0.05mA-Izt 0.05 1uA-Ir 5 SOD-523 3K/REEL
K4H281638A-TCA0 DIODE ZENER SINGLE 500mW 6.8Vz 0.05mA-Izt 0.05 0.1uA-Ir 5.1 SOD-123 3K/REEL
K4H1G1638A-TCA0 DIODE ZENER SINGLE 500mW 7.5Vz 0.05mA-Izt 0.05 0.1uA-Ir 5.7 SOD-123 3K/REEL
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