參數(shù)資料
型號: K4D263238E-GC36
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: DIODE ZENER TRIPLE ISOLATED 200mW 16.1Vz 10mA-Izt 0.02547 0.05uA-Ir 12 SOT-363 3K/REEL
中文描述: 100萬x 32Bit的× 4銀行圖形雙數(shù)據(jù)速率同步DRAM的雙向數(shù)據(jù)選通和DLL
文件頁數(shù): 14/17頁
文件大小: 310K
代理商: K4D263238E-GC36
128M GDDR SDRAM
K4D263238E-GC
- 14 -
Rev 1.7 (Nov. 2003)
Note 1 :
- The JEDEC DDR specification currently defines the output data valid window(tDV) as the time period when the data
strobe and all data associated with that data strobe are coincidentally valid.
- The previously used definition of tDV(=0.35tCK) artificially penalizes system timing budgets by assuming the worst case
output vaild window even then the clock duty cycle applied to the device is better than 45/55%
- A new AC timing term, tQH which stands for data output hold time from DQS is difined to account for clock duty cycle
variation and replaces tDV
- tQHmin = tHP-X where
. tHP=Minimum half clock period for any given cycle and is defined by clock high or clock low time(tCH,tCL)
. X=A frequency dependent timing allowance account for tDQSQmax
tQH Timing (CL4, BL2)
1
tHP
CK, CK
DQS
DQ
CS
2
5
0
COMMAND
READA
tQH
Qa0
tDQSQ(max)
tDQSQ(max)
3
4
Qa1
VALID
NOP
NOP
NOP
NOP
NOP
NOP
VALID
t
IS
t
IS
CK, CK
CKE
Command
Exit Powr Down mode
Enter Power Down mode
(Read or Write operation
must not be in progress)
3t
CK
Power Down Timing
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K4D263238E-GC40 DIODE ZENER SINGLE 300mW 17.9Vz 10mA-Izt 0.02545 0.05uA-Ir 14 SOT-23 3K/REEL
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