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參數(shù)資料
| 型號： | HS1-0509RH-Q |
| 廠商： | INTERSIL CORP |
| 元件分類： | 運(yùn)動控制電子 |
| 英文描述： | Radiation Hardened Single 8/Differential 4-Channel CMOS Analog Multiplexers |
| 中文描述： | 4-CHANNEL, DIFFERENTIAL MULTIPLEXER, CDIP16 |
| 封裝： | CERDIP-16 |
| 文件頁數(shù)： | 4/6頁 |
| 文件大?。?/td> | 164K |
| 代理商： | HS1-0509RH-Q |
4
Burn-In/Life Test Circuits
HS-0508RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V1 = -15V maximum, -16V minimum
V2 = +15V minimum, +16V maximum
R1 = 10k
±
5% 1/4W
C1 = C2 = 0.01
μ
F minimum (per socket) or 0.1
μ
F minimum (per row)
D1 = D2 = 1N4002 (or equivalent)
F0 = 100kHz 50% duty cycle; VIL = 0.8V max; VIH = 4.0V min.
F1 = F0/2
F2 = F1/2
F3 = F2/2
HS-0508RH
STATIC BURN-IN TEST CIRCUIT
V1 = 5V minimum, 6V maximum
V2 = -15V maximum, -16V minimum
V3 = +15V minimum, +16V maximum
R1 = 10k
±
5% 1/4W
C1 = C2 = 0.01
μ
F minimum (per socket) or 0.1
μ
F minimum (per row)
D1 = D2 = 1N4002 (or equivalent)
HS-0509RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V2 = +15.5V,
±
.0.5V
V3 = -15.5V,
±
0.5V
R1 = 10k
,
±
5%
C1 = 0.1
μ
F minimum (per socket)
D1 = 1N4002 or equivalent (per board)
F0 = 100kHz,
±
10%; F1 = F0/2; F2 = F1/2, 50% duty cycle,
VIL = 0.8V max.; VIH = 4.0V min.
HS-0509RH
STATIC BURN-IN TEST CIRCUIT
V1 = +5.5V,
±
0.5V
V2 = +15.5V,
±
0.5V
V3 = -15.5V,
±
0.5V
R1 = 10k
,
±
10%
C1 = 0.1
μ
F minimum (per socket)
D1 = 1N4002 or equivalent (per board)
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
F0
F3
V1
D1
C1
R1
F1
F2
V2
D2
C2
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
V2
D1
C1
R1
V1
V3
D2
C2
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
F0
F2
V2
V3
D1
C1
R1
R1
D1
C1
F1
V2
V3
D1
C1
R1
R1
D1
C1
V1
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
HS-0508RH, HS-0509RH
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