參數(shù)資料
型號: HEF4511BP
廠商: NXP Semiconductors N.V.
元件分類: 通用總線功能
英文描述: BCD to 7-segment latch-decoder-driver
封裝: HEF4511BP<SOT38-4 (DIP16)|<<http://www.nxp.com/packages/SOT38-4.html<1<Always Pb-free,;HEF4511BT<SOT109-1 (SO16)|<<http://www.nxp.com/packages/SOT109-1.html<1<week
文件頁數(shù): 12/20頁
文件大?。?/td> 191K
代理商: HEF4511BP
HEF4511B
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 7 — 11 November 2011
12 of 20
NXP Semiconductors
HEF4511B
BCD to 7-segment latch/decoder/driver
a. Input waveforms
b. Test circuit
Test data is given in
Table 10
.
Definitions for test circuit:
DUT = Device Under Test.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
Test circuit for measuring switching times
Fig 8.
V
M
V
M
t
W
t
W
10 %
90 %
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
90 %
10 %
t
f
t
r
t
r
t
f
001aaj781
V
DD
V
I
V
O
001aag182
DUT
CL
RT
G
Table 10.
Supply voltage
Measurement points and test data
Input
V
I
V
DD
Load
C
L
50 pF
V
M
0.5V
I
t
r
, t
f
20 ns
5 V to 15 V
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