參數(shù)資料
型號(hào)： HEF4060BP
廠商： NXP Semiconductors N.V.
元件分類： 通用總線功能
英文描述： 14-stage ripple-carry binary counter-divider and oscillator
封裝： HEF4060BP<SOT38-4 (DIP16)|<<http://www.nxp.com/packages/SOT38-4.html<1<Always Pb-free,;HEF4060BT<SOT109-1 (SO16)|<<http://www.nxp.com/packages/SOT109-1.html<1<week
文件頁(yè)數(shù)： 7/15頁(yè)
文件大?。?/td> 150K
代理商： HEF4060BP
HEF4060B
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 6 — 11 May 2011
7 of 15
NXP Semiconductors
HEF4060B
14-stage ripple-carry binary counter/divider and oscillator
13. RC oscillator
13.1 Timing component limitations
The oscillator frequency is mainly determined by R
t
×
C
t
, provided R
t
<< R2 and
R2
×
C2 << R
t
×
C
t
. The influence of the forward voltage across the input protection
diodes on the frequency is minimized by R2. The stray capacitance C2 should be kept as
small as possible. In consideration of accuracy, C
t
must be larger than the inherent stray
capacitance. R
t
must be larger than the LOCMOS (Local Oxidation Complementary
Metal-Oxide Semiconductor) ‘ON’ resistance in series with it, which typically is 500
Ω
at
V
DD
= 5 V, 300
Ω
at V
DD
= 10 V and 200
Ω
at V
DD
= 15 V.
Test data is given in
Table 10
.
Definitions for test circuit:
DUT = Device Under Test;
C
L
= load capacitance including jig and probe capacitance;
R
T
= termination resistance should be equal to the output impedance Z
o
of the pulse generator.
Test circuit for switching times
Fig 5.
V
DD
V
I
V
O
001aag182
DUT
CL
RT
G
Table 10.
Supply voltage
V
DD
5 V to 15 V
Measurement point and test data
Input
V
I
V
SS
or V
DD
Load
C
L
50 pF
t
r
, t
f
≤
20 ns
Typical formula for oscillator frequency:
Fig 6.
External component connection for RC oscillator
001aae655
R2
Rt
Ct
C2
RS
MR (from logic)
REXT
10
CEXT
9
11
HEF4060B
f
osc
R
t
2.3
×
C
t
×
------------------------------
=
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