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參數(shù)資料
| 型號(hào)： | HCTS30MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened 8-Input NAND Gate |
| 中文描述： | 輻射加固8輸入與非門 |
| 文件頁(yè)數(shù)： | 6/10頁(yè) |
| 文件大?。?/td> | 134K |
| 代理商： | HCTS30MS |
445
Specifications HCTS30MS
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
8, 9, 10, 13
1 - 5, 6, 7, 11, 12
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
8, 9, 10, 13
7
-
1 - 5, 6, 11, 12, 14
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
9, 10, 13
7
8
14
1 - 5, 6, 11, 12
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1K
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
8, 9, 10, 13
7
1, 2, 3, 4, 5, 6, 11, 12, 14
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518639
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| HCTS32K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input OR Gate |
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