- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄384395 > HCS32HMSR (HARRIS SEMICONDUCTOR) Radiation Hardened Quad 2-Input OR Gate PDF資料下載
參數(shù)資料
| 型號(hào)： | HCS32HMSR |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened Quad 2-Input OR Gate |
| 中文描述： | HC/UH SERIES, QUAD 2-INPUT OR GATE, UUC14 |
| 文件頁(yè)數(shù)： | 4/8頁(yè) |
| 文件大小： | 179K |
| 代理商： | HCS32HMSR |
76
Specifications HCS32MS
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
±
5
μ
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), (Note 3)
+25
o
C
-
-
-
Data to Output
TPHL
VCC = 4.5V
+25
o
C
2
20
ns
TPLH
VCC = 4.5V
+25
o
C
2
22
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
3
μ
A
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTES:
1. Alternate group A inspection in accordance with method 5005 of MIL-STD-883 may be exercised.
2. Table 5 parameters only.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Spec Number
518768
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HCS74T | Radiation Hardened Dual-D Flip-Flop with Set and Reset(抗輻射雙D觸發(fā)器（帶設(shè)置和復(fù)位）) |
| HCTS02D | Radiation Hardened Quad 2-Input NOR Gate |
| HCTS02DMSR | Radiation Hardened Quad 2-Input NOR Gate |
| HCTS02K | Radiation Hardened Quad 2-Input NOR Gate |
| HCTS02KMSR | Radiation Hardened Quad 2-Input NOR Gate |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HCS32K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input OR Gate |
| HCS32KMSR | 制造商:Intersil Corporation 功能描述:OR GATE 4-ELEM 2-IN CMOS 14CFPAK - Bulk |
| HCS32MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input OR Gate |
| HCS32MS_07 | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input OR Gate |
| HCS360 | 制造商:MICROCHIP 制造商全稱:Microchip Technology 功能描述:KEELOQ㈢ Code Hopping Encoder |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。