參數(shù)資料
型號(hào): GS81302D10E-300I
廠商: GSI TECHNOLOGY
元件分類: SRAM
英文描述: 16M X 9 DDR SRAM, 0.45 ns, PBGA165
封裝: 15 X 17 MM, 1 MM PITCH, FPBGA-165
文件頁(yè)數(shù): 9/33頁(yè)
文件大?。?/td> 687K
代理商: GS81302D10E-300I
Capacitance
oC, f = 1 MHZ, VDD = 1.8 V)
Parameter
Symbol
Test conditions
Typ.
Max.
Unit
Input Capacitance
CIN
VIN = 0 V
4
5
pF
Output Capacitance
COUT
VOUT = 0 V
6
7
pF
Clock Capacitance
CCLK
VIN = 0 V
5
6
pF
Note:
This parameter is sample tested.
AC Test Conditions
Parameter
Conditions
Input high level
1.25
Input low level
0.25 V
Max. input slew rate
2 V/ns
Input reference level
0.75
Output reference level
VDDQ/2
Note:
Test conditions as specified with output loading as shown unless otherwise noted.
Preliminary
GS81302D07/10/19/37E-450/400/350/333/300
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.03 12/2010
17/33
2008, GSI Technology
DQ
VT == 0.75 V
50
Ω
RQ = 250
Ω (HSTL I/O)
VREF = 0.75 V
AC Test Load Diagram
Input and Output Leakage Characteristics
Parameter
Symbol
Test Conditions
Min.
Max
Input Leakage Current
(except mode pins)
IIL
VIN = 0 to VDDQ
–2 uA
2 uA
Doff
IILDOFF
VIN = 0 to VDDQ
–20 uA
2 uA
ODT
IIL ODT
VIN = 0 to VDDQ
–2 uA
20 uA
Output Leakage Current
IOL
Output Disable,
VOUT = 0 to VDDQ
–2 uA
2 uA
(TA = 25
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