- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄362734 > EP1C6T256I8ES (Altera Corporation) Cyclone FPGA Family Data Sheet PDF資料下載
參數(shù)資料
| 型號： | EP1C6T256I8ES |
| 廠商： | Altera Corporation |
| 英文描述： | Cyclone FPGA Family Data Sheet |
| 中文描述： | 氣旋的FPGA系列數(shù)據(jù)手冊 |
| 文件頁數(shù)： | 63/104頁 |
| 文件大?。?/td> | 763K |
| 代理商： | EP1C6T256I8ES |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁第38頁第39頁第40頁第41頁第42頁第43頁第44頁第45頁第46頁第47頁第48頁第49頁第50頁第51頁第52頁第53頁第54頁第55頁第56頁第57頁第58頁第59頁第60頁第61頁第62頁當(dāng)前第63頁第64頁第65頁第66頁第67頁第68頁第69頁第70頁第71頁第72頁第73頁第74頁第75頁第76頁第77頁第78頁第79頁第80頁第81頁第82頁第83頁第84頁第85頁第86頁第87頁第88頁第89頁第90頁第91頁第92頁第93頁第94頁第95頁第96頁第97頁第98頁第99頁第100頁第101頁第102頁第103頁第104頁
Altera Corporation
January 2007
3–1
Preliminary
3. Configuration & Testing
IEEE Std. 1149.1
(JTAG) Boundary
Scan Support
All Cyclone
devices provide JTAG BST circuitry that complies with the
IEEE Std. 1149.1a-1990 specification. JTAG boundary-scan testing can be
performed either before or after, but not during configuration. Cyclone
devices can also use the JTAG port for configuration together with either
the Quartus
II software or hardware using either Jam Files (
.jam
) or Jam
Byte-Code Files (
.jbc
).
Cyclone devices support reconfiguring the I/O standard settings on the
IOE through the JTAG BST chain. The JTAG chain can update the I/O
standard for all input and output pins any time before or during user
mode. Designers can use this ability for JTAG testing before configuration
when some of the Cyclone pins drive or receive from other devices on the
board using voltage-referenced standards. Since the Cyclone device
might not be configured before JTAG testing, the I/O pins might not be
configured for appropriate electrical standards for chip-to-chip
communication. Programming those I/O standards via JTAG allows
designers to fully test I/O connection to other devices.
The JTAG pins support 1.5-V/1.8-V or 2.5-V/3.3-V I/O standards. The
TDO pin voltage is determined by the V
CCIO
of the bank where it resides.
The bank V
CCIO
selects whether the JTAG inputs are 1.5-V, 1.8-V, 2.5-V, or
3.3-V compatible.
Cyclone devices also use the JTAG port to monitor the operation of the
device with the SignalTap
II embedded logic analyzer. Cyclone devices
support the JTAG instructions shown in
Table 3–1
.
Table 3–1. Cyclone JTAG Instructions (Part 1 of 2)
JTAG Instruction
Instruction Code
Description
SAMPLE
/
PRELOAD
00 0000 0101
Allows a snapshot of signals at the device pins to be captured and
examined during normal device operation, and permits an initial
data pattern to be output at the device pins. Also used by the
SignalTap II embedded logic analyzer.
EXTEST
(1)
00 0000 0000
Allows the external circuitry and board-level interconnects to be
tested by forcing a test pattern at the output pins and capturing test
results at the input pins.
BYPASS
11 1111 1111
Places the 1-bit bypass register between the
TDI
and
TDO
pins,
which allows the BST data to pass synchronously through selected
devices to adjacent devices during normal device operation.
C51003-1.3
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| EP1C6T324C6ES | Cyclone FPGA Family Data Sheet |
| EP1C6T324C7ES | Cyclone FPGA Family Data Sheet |
| EP1C6T324C8ES | Cyclone FPGA Family Data Sheet |
| EP1C6T324I6ES | Cyclone FPGA Family Data Sheet |
| EP1C6T324I7ES | Cyclone FPGA Family Data Sheet |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| EP1F | 制造商:NEC 制造商全稱:NEC 功能描述:HIGH HEAT RESISTIVITY |
| EP1F-B3G1 | 制造商:NEC 制造商全稱:NEC 功能描述:HIGH HEAT RESISTIVITY |
| EP1FB3G1S | 制造商:World Products 功能描述:Electromechanical Relay SPDT 25A 12VDC 225Ohm Through Hole |
| EP1F-B3G1T | 制造商:NEC 制造商全稱:NEC 功能描述:HIGH HEAT RESISTIVITY |
| EP1F-B3G1TT | 制造商:NEC 制造商全稱:NEC 功能描述:HIGH HEAT RESISTIVITY |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。