
AMD
14
MACH230-18/24 (Ind)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
Ambient Temperature
with Power Applied
. . . . . . . . . . . . .
Supply Voltage with
Respect to Ground
. . . . . . . . . . . . .
DC Input Voltage
. . . . . . . . . . . .
DC Output or
I/O Pin Voltage
. . . . . . . . . . . . .
Static Discharge Voltage
Latchup Current
(T
A
=–40
°
C to +85
°
C)
–65
°
C to +150
°
C
. . . . . . . . . . .
–55
°
C to +125
°
C
–0.5 V to +7.0 V
–0.5 V to V
CC
+ 0.5 V
–0.5 V to V
CC
+ 0.5 V
. . . . . . . . . . . . . . . . .
2001 V
200 mA
. . . . . . . . . . . . . . . . . .
Stresses above those isted under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
INDUSTRIAL OPERATING RANGES
Ambient Temperature (T
A
)
Operating in Free Air
. . . . . . . . . . . .
–40
°
C to +85
°
C
Supply Voltage (V
CC
) with
Respect to Ground
+4.5 V to +5.5 V
. . . . . . . . . . . . . .
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC CHARACTERISTICS over INDUSTRIAL operating ranges unless otherwise specified
Parameter
Symbol
Parameter Description
Test Conditions
V
OH
Output HIGH Voltage
I
OH
= –3.2 mA, V
CC
= Min
V
IN
= V
IH
or V
IL
V
OL
Output LOW Voltage
I
OL
= 16 mA, V
CC
= Min
V
IN
= V
IH
or V
IL
V
IH
Input HIGH Voltage
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
V
IL
Input LOW Voltage
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
I
IH
Input HIGH Leakage Current
V
IN
= 5.25 V, V
CC
= Max (Note 2)
I
IL
Input LOW Leakage Current
V
IN
= 0 V, V
CC
= Max (Note 2)
I
OZH
Off-State Output Leakage
V
OUT
= 5.25 V, V
CC
= Max
Current HIGH
V
IN
= V
IH
or V
IL
(Note 2)
I
OZL
Off-State Output Leakage
V
OUT
= 0 V, V
CC
= Max
Current LOW
V
IN
= V
IH
or V
IL
(Note 2)
I
SC
Output Short-Circuit Current
V
OUT
= 0.5 V, V
CC
= Max (Note 3)
I
CC
Supply Current (Typical)
V
CC
= 5 V, T
A
= 25
°
C, f = 25 MHz (Note 4)
Min
2.4
Typ
Max
Unit
V
0.5
V
2.0
V
0.8
V
10
–10
10
μ
A
μ
A
μ
A
–10
μ
A
–30
–130
mA
mA
235
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included.
2. I/O pin leakage is the worst case of I
IL
and I
OZL
(or I
IH
and I
OZH
).
3. Not more than one output should be shorted at a time. Duration of the short-circuit should not exceed one second.
V
OUT
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
4. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of
being loaded, enabled, and reset.